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Applied Scanning Probe Methods IV Industrial Applications (NanoScience and Technology)

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Published by Springer .
Written in English

Subjects:

  • Science/Mathematics,
  • Nanotechnology,
  • Science,
  • Technology & Industrial Arts,
  • Chemistry - Analytic,
  • Physics,
  • Material Science,
  • Nanoscience,
  • Physical Chemistry,
  • Technology / Nanotechnology,
  • Chemistry - Physical & Theoretical,
  • Materials,
  • Microscopy

Book details:

Edition Notes

ContributionsBharat Bhushan (Editor), Harald Fuchs (Editor)
The Physical Object
FormatHardcover
Number of Pages284
ID Numbers
Open LibraryOL9055713M
ISBN 103540269126
ISBN 109783540269120

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In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes.   Applied Scanning Probe Methods IV by Bharat Bhushan, , available at Book Depository with free delivery worldwide. Applied Scanning Probe Methods IV: Bharat Bhushan: We use cookies to give you the best possible experience. ISBN: OCLC Number: Description: xliv, pages ; 25 cm: Contents: (Following volume III) Scanning probe lithography for chemical, biological and engineering applications Nanotribological characterization of human hair and skin using atomic force microscopy (AFM) Nanofabrication with self-assembled manolayers by scanning probe lithography Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that Cited by:

Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques (NanoScience and Technology) (v. 2) [Bhushan, Bharat, Fuchs, Harald] on *FREE* shipping on qualifying offers. Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques (NanoScience and Technology) (v. 2)Format: Hardcover. Applied Scanning Probe Methods III: Characterization (NanoScience and Technology) (v. 3) [Bhushan, Bharat, Fuchs, Harald] on *FREE* shipping on qualifying offers. Applied Scanning Probe Methods III: Characterization (NanoScience and Technology) (v. 3)Format: Hardcover. Get this from a library! Applied scanning probe methods IV: industrial applications.. [Bharat Bhushan; Harald Fuchs;] -- Annotation Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and . Applied Scanning Probe Methods III Characterization XLIV, p. illus., 2 in color. Hardcover NanoScience and Technology $ ISBN: Volume 4 Bharat Bhushan, Ohio State University, Columbus, OH, USA; Harald Fuchs, University of Münster, Germany (Eds.) Applied Scanning Probe Methods IV Industrial ApplicationsFile Size: KB.

Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early Request PDF | On Jan 1, , Bharat Bhushan and others published Applied Scanning Probe Methods IX | Find, read and cite all the research you need on ResearchGate. Local oxidation nanolithography (LON) is a tip-based nanofabrication method. It is based on the spatial confinement on an oxidation reaction under the sharp tip of an atomic force microscope.. The first materials on which LON was demonstrated were Si() and polycrystalline uently, the technique has been extended to III–V semiconductors, silicon carbide, metals such as. Scanning probe microscope (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in , with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic first successful scanning tunneling microscope experiment was done by Binnig and Rohrer.